Contact: Melodie Fickenscher, PhD 513-556-3320 fickenm@uc.edu - PowerPoint PPT Presentation
Contact: Melodie Fickenscher, PhD 513-556-3320 fickenm@uc.edu Scanning Electron Microscopy FEI ApreoC Low-Vac FEI SCIOS Dual-Beam SEM/FIB Hitachi S-3400N Capabilities Low Vac imaging of non-conductive samples
Contact: Melodie Fickenscher, PhD 513-556-3320 fickenm@uc.edu Scanning Electron Microscopy • FEI ApreoC Low-Vac • FEI SCIOS Dual-Beam SEM/FIB • Hitachi S-3400N Capabilities • Low Vac imaging of non-conductive samples • Sectioning with Focused Ion Beam • Elemental Analysis (EDX) • EBSD • E-beam Lithography • STEM
Contact: Melodie Fickenscher, PhD 513-556-3320 fickenm@uc.edu Other Characterization Tools Transmission Electron Atomic Force Microscopy X-Ray Diffraction Differential Scanning Light Microscopy Microscopy Calorimeter • Dimension D-3100 • Panalytical XRPD • LV150 Nikon • CM-20 200Kv LaB6 • Wet-Cell • -90 to 550C • ICDD PDF 4 Database • Brightfield/Darkfield • Contact/Tapping • Auto Sampler • Jade software • Polarizer • Elemental Analysis • TGA available in private • Reflected light lab • Metallurgical • Image Acquisition System
West Campus Cores Mass Spectrometry Facility Environmental Analysis Service Center (EASC) X-ray Crystallography Facility Advanced Materials Characterization Center (AMCC) Nuclear Magnetic Resonance (NMR) ERC Clean Room Facility Chemical Sensors & Biosensors Ohio Center for Microfluidic Instrumentation Facility Innovation (OCMI) Plasma Spectrochemical Analysis Digital Fabrication Lab and Metallomics Center Confocal Microscope Core
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