Reliability Performance of TE SubComs Generation-3 DPSK HPOE - - PowerPoint PPT Presentation

reliability performance of te subcom s generation 3 dpsk
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Reliability Performance of TE SubComs Generation-3 DPSK HPOE - - PowerPoint PPT Presentation

conference & convention enabling the next generation of networks & services Reliability Performance of TE SubComs Generation-3 DPSK HPOE Generation-3 DPSK HPOE Barbara Dean and Charles Breverman Tyco Electronics Subsea


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Reliability Performance of TE SubCom’s Generation-3 DPSK HPOE Generation-3 DPSK HPOE

Barbara Dean and Charles Breverman

Tyco Electronics Subsea Communications

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Presenter Profile

Barbara joined Bell Laboratories after receiving her

  • Ph. D. in Chemical Physics from Ohio State
  • University. She has contributed to the development

and reliability analysis of optical transmitters, receivers and passive components for both terrestrial and undersea applications. Her engineering team was responsible for the qualification and certification

Place picture here

responsible for the qualification and certification strategy for undersea pump lasers. Barbara later joined the undersea system division (now TE SubCom) and is currently responsible for Quality Management implementation and Reliability Management and assessment.

Barbara Dean Managing Director Email: bdean@subcom.com Tel: (+1) 732 578 7874 Mobile Tel: (+1) 732 856 4511

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Outline

  • Introduction
  • Architecture of HPOE
  • Initial Estimate of Reliability
  • Risk Issues in Design and Start of Manufacture
  • Risk Issues in Design and Start of Manufacture
  • Field Experience
  • Conclusions
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Introduction

  • The final capacity per Digital Line Segment in undersea

communication systems has roughly doubled in the past five years.

  • One consequence of the increased capacity is the

possibility of over 100 transmit/receivers (High possibility of over 100 transmit/receivers (High Performance Optical Equipment or HPOE) per line-pair in a station.

  • Management of reliability is crucial to prevent excess costs

due to outage mitigation, sparing and station staffing.

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Subcom’s Gen-3 HPOE

  • Single circuit pack

providing bidirectional transmission

  • Occupies a single slot in
  • Occupies a single slot in

the Common Shelf

  • Enhanced FEC
  • Wavelength tunable

transmission laser

  • RZ-DPSK format
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Key Considerations

Where possible, choose parts from suppliers with a proven record of excellent reliability in both terminal and submerged equipment. Push these suppliers to meet performance specifications, rather than immediately opting for an unproven rather than immediately opting for an unproven supplier that claims to meet the specification. Take advantage of improvements in monolithic integration, with more of the required functionality executed in fewer ICs. Eliminate adhesives in the optical path – especially important for new entrants.

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Types of Components for Each Functionality

FEC Processing

  • FEC Processor

Client Interface

  • XFP Module
  • Serializer/Deserializer

Increased Integration FEC Processing

  • Oscillators

Line Transmitter

  • Logic IC
  • Tunable Laser
  • Modulator

Integration

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Types of Components for Each Functionality

Line Receiver

  • Logic IC
  • PIN-TIA
  • DPSK Demodulator
  • Optical Amplifiers

High Reliability Suppliers Other

  • Optical Amplifiers
  • Optical Jumpers
  • Discrete Components
  • Firmware
  • PWB / EMS
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Initial Estimate of Component Failure Rate

  • Considered the failure rate estimated from

Telcordia aging tests

– These estimates are likely to be very conservative due to limited sample size

  • Considered failure rates based on field
  • Considered failure rates based on field

experience of similar parts from same wafer fab and packaging house

– Must understand if parts are likely to be returned upon failure and the FMA capability of the supplier

  • SubCom’s experience with similar parts and

technology

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Early Estimate of HPOE Reliability

Module Functionality FITs @90% c.l., 65° ° ° °C

Client Interface 2,100 FEC Processing 690 Line Transmitter 3,080 Line Receiver 5,150 Optical Amplifiers 4,550 Optical Jumpers 450 PWB, passive electrical components, firmware 3,000 Estimated Total FITs ~19,000

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Risk Issues in Design and Start of Manufacture

Typical issue – migration of IC package from ceramic to plastic occurred during Models phase causing qualification approval of component to be simultaneous with start of production simultaneous with start of production Atypical issue – discovery of counterfeit parts

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Types of Counterfeit Parts

Dummy packages Parts with labeling that misrepresent the part’s form, fit, function or origin (including Pb-free solder) Parts that are labeled as having undergone Parts that are labeled as having undergone additional reliability screening, but have not Parts rejected by the manufacturer’s test and inspection process Used parts represented as new

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Counterfeit Parts Encountered

Very high in-process failure rate of a chip capacitor – Suspect used part sold as new A few in-process failures of an IC from a respected supplier

– Request for FMA led to discovery that the Serial Number – Request for FMA led to discovery that the Serial Number was bogus – Suspect relabeled or purpose-built counterfeit part World-wide supply of the true part was very much smaller than assumed, leading to a potential schedule risk

Flash memory chip query returned the information that the chip was from Supplier A

– Package labeled as Supplier B – Purpose built counterfeit part

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Countering Counterfeit Parts

Treat as Intellectual Property theft and inform the victimized supplier and any counterfeit data repositories Purchase from Authorized Distributors or from Distributors open to audits and supplying life Distributors open to audits and supplying life traceability of the part Use EMS with a Counterfeit Part plan and ability to test subtle features All countermeasures put in place before start of manufacture

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00 2000 2500 3000 HPOEs

Number of Deployed Active HPOEs

Field Experience

  • the number of active HPOEs

deployed in systems or upgrades that have completed the acceptance process

Time 500 1000 1500

12/31/2006 12/31/2007 12/31/2008 12/31/2009

# Active HP

Dec ‘09 Dec ‘07 Dec ‘08 Dec ‘06

process

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Distribution of Size of HPOE Installations

llations 15 20

  • “Installation” - the number of

active HPOEs ordered for a network build or upgrade

  • The most frequent

installation size is N~24

# HPOEs per Installation # Installat 100 200 300 400 500 600 5 10

installation size is N~24

  • Uncertainty associated with

a confidence that the failure rate of a given installation is the same as predicted scales as

N / 1

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Evolution of Return Rate with Time

  • The Estimated

Return Rate is the point estimate

– Ratio of total number of returns to total active HPOEs

15000 20000 turn Rate (FITs)

Time Evolution of HPOE Return Rate

Component-Based Failure Estimate

total active HPOEs deployed at the end

  • f the time period

– No “confidence level” attached – represents what the systems actually experienced

Time 5000 10000

12/31/2006 12/31/2007 12/31/2008 12/31/2009

Estimated Retur

Dec ‘06 Dec ‘07 Dec ‘08 Dec ‘09

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Observations on Return Rate

At all times, the population return rate is lower than the original conservative estimate There is a peak after the first year of deployment followed by a steady decrease Increase in population size will make the estimate Increase in population size will make the estimate more robust, but not by itself lead to the observed decrease Is a very low return rate for newer installations masking continued higher return rate for earlier installations?

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10000 15000 rn Rate (FITs)

Return Rate by Quarter Year

All HPOEs Deployed First 500 HPOEs Deployed Last 500 HPOEs Deployed

Latest Return Rates

  • The first 500 HPOEs

deployed are compared to the last 500 HPOEs deployed in 2008

  • All populations are

contributing to the lower

Time 5000 10

03/31/2009 07/31/2009 11/30/2009 03/31/2010

Estimated Return

Mar ‘09 Mar ‘10

contributing to the lower return rate

  • Further implies that

‘turn-on’ issues were dealt with quickly and effectively

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Remaining Contributors to Return Rate

Electronic / Board Mechanical

  • Essentially the last line item in the
  • riginal estimate
  • Mechanical mismatch – very low rate;

issue resolved

  • Electronic random failures – there are
  • Electronic random failures – there are

no trends with respect to component or suppliers Points to an opportunity for additional focus on ‘low tech’ components and Electronic Manufacturing

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Conclusions

During development of the Gen-3 HPOE, SubCom instituted measures designed to improve the overall reliability At all times since the initial deployment, the return rate of the population was lower than the conservative component- based estimate The return rate for the past 5 quarters has been below 5,000

  • FITs. The improvements are valid for populations that were
  • FITs. The improvements are valid for populations that were

deployed early in the product cycle and those deployed most recently The remaining cause for returns is random failure of electronic parts These techniques, with additional emphasis on Electronic Manufacture, are being used in the next generations under development

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SLIDE 22

2010

conference & convention

Pacifico Convention Plaza Yokohama & InterContinental The Grand Yokohama 11 ~ 14 May 2010 www.suboptic.org The 7th International Conference & Convention

  • n Undersea Telecommunications