SAMPA linearity test results SAMPAmeeting 11.03.2015 Sohail Musa - PowerPoint PPT Presentation
SAMPA linearity test results SAMPAmeeting 11.03.2015 Sohail Musa Mahmood on behalf of SAMPA team and Norwegian group Gain and Peaking time Setup configuration Connecting a small capacitance in series with the input cable. Applying an
SAMPA linearity test results SAMPAmeeting 11.03.2015 Sohail Musa Mahmood on behalf of SAMPA team and Norwegian group
Gain and Peaking time Setup configuration • Connecting a small capacitance in series with the input cable. • Applying an input signal (square wave, ramp up/down, exponential rise/fall ). • Connecting the input signal directly to the detector pads. • Setting the configuration of the analog chip. • Observe the differential output at the corresponding channel.
Setup configuration
Gain Results 30mV/fC 31.20 31.00 30.80 30.60 30.40 30.20 30.00 29.80 29.60 29.40 29.20 29.00 28.80 28.60 28.40 28.20 28.00 27.80 27.60 27.40 27.20 27.00 26.80 30mV/fC@160ns + 30mV/fC@160ns - 30mV/fC@80ns + 30mV/fC@80ns -
Gain Results
30mV/fC@160 ns - Linearity
20mV/fC@160 ns - Linearity
30mV/fC@160 ns (pos) – Linearity – all channels
30mV/fC@160 ns (pos) – Linearity – mean value
30mV/fC@160 ns (pos)- Linearity INL
30mV/fC@160 ns (neg) – Linearity All channels
30mV/fC@160 ns – Linearity INL – ALL CHANNELS
30mV/fC@160 ns (neg) – Linearity MEAN
30mV/fC@160 ns (neg) – Linearity MEAN - INL
20mV/fC@160 ns (pos) – Linearity ALL channels
20mV/fC@160 ns (pos) – Linearity MEAN
20mV/fC@160 ns (pos) – Linearity MEAN - INL
20mV/fC@160 ns (neg) – Linearity ALL channels
20mV/fC@160 ns (neg) – Linearity MEAN
20mV/fC@160 ns (neg) – Linearity MEAN - INL
Conclusion • Linearity seems to be good. • Some issues with the desired gain. • More oscillations on channel 1 than other channels. (tested 2 chips) • Some more linearity results for the chip 3 analog part (only for positive configurations)
On going work and future plans • Analysing the results for statistical linearity measurements. • Preparing the setup for first irradition tests of SAMPA MPW1. • Single-Event Latchup tests on all 3 chips and Single Event Upset tests on shift registers (chip 3). • Planning to perform the first irradiation tests in the end of april in Uppsala (together with RCU2 testing).
Thank you for your attention. Any questions ?
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